DocumentCode :
3516311
Title :
The Criteria of Functional Delay Test Quality Assessment
Author :
Bareisa, E. ; Jusas, V. ; Motiejunas, K. ; Seinauskas, R.
Author_Institution :
Software Eng. Dept., Kaunas Univ. of Technol., Kaunas, Lithuania
fYear :
2007
fDate :
29-31 Aug. 2007
Firstpage :
207
Lastpage :
214
Abstract :
The test can be developed at the functional level of the circuit. Such an approach allows developing the test at the early stages of the design process in parallel with other activities of this process. The main problem is the quality assessment of the functional test because the implementation of the circuit is not available yet. The paper presents the criteria of the quality assessment of the functional delay test consisting of the pairs of patterns with multiple signal transition. The introduced criteria of the quality assessment of the functional delay test are based solely on the primary input values and the primary output values of the software prototype. The use of the indirect impact of the inputs to the outputs in the criteria of the quality assessment is introduced for the first time. The presented experimental results explore the relationship between the value of the presented criterion and the transition fault coverage at the gate level.
Keywords :
delays; fault simulation; integrated circuit design; integrated circuit testing; chip testing; delay fault detection; design process; fault simulation; functional delay test quality assessment; multiple signal transition; software prototype; transition fault; Circuit faults; Circuit testing; Clocks; Delay; Electrical fault detection; Fault detection; Manufacturing; Quality assessment; Software prototyping; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design Architectures, Methods and Tools, 2007. DSD 2007. 10th Euromicro Conference on
Conference_Location :
Lubeck
Print_ISBN :
978-0-7695-2978-3
Type :
conf
DOI :
10.1109/DSD.2007.4341470
Filename :
4341470
Link To Document :
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