A self-diagnosis technique using Reed-Solomon codes for self-repairing chips

A self-diagnosis circuit that can be used for builtin self-repair is proposed. The circuit under diagnosis is assumed to be comprised of a large number of field repairable units (FRUs), which can be replaced with spares when they are found to be defective. Since the proposed self-diagnosis circuit is implemented on the chip, responses that are scanned out of scan chains are compressed first by the space compression circuit and then by the time compression circuit to reduce the volume of test response data. Both the space and the time compression circuit implement a Reed-Solomon code. Unlike prior work, in the proposed technique, responses of all FRUs are observed at the same time to reduce diagnosis time. The proposed diagnosis circuit can locate up to l defective FRUs. We propose a novel space-compression circuit that reduces hardware overhead by exploiting the frequency difference of the scan shift clock and the system clock. When the size of constituent multiple-input signature-register (MISR) is m, the total number of signatures to be stored for the fault-free signature is 2lmB bits, where 1 les B les m. The experimental results show that the proposed diagnosis circuit that can locate up to 4 defective FRUs in the same test session can be implemented with less than 1% of hardware overhead for a large industrial design. Hardware overhead for the diagnosis circuit is lower for large CUDs.