DocumentCode :
3516332
Title :
Reassessment of classic recombination mechanisms in silicon point contact concentrator solar cell
Author :
Herasimenka, Stanislau ; Altermatt, Pietro ; Bowden, Stuart ; Honsberg, C.
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Three dimensional numerical model of silicon point contact concentrator solar cell was built based on the recently established set of accurate empirical models and parameters, The model was applied to reassess the loss mechanisms acting in point contact cells as previously described in a classic paper by Sinton and Swanson. The main difference was found due to injection dependence of surface recombination velocity, which wasn´t considered previously. Mostly because of this fact, surface recombination was shown to dominate recombination losses at up to 30 W/cm2 light intensities. Although a good fit to the measured open circuit voltages, the built model is missing actual diffusion profiles and exact measured surface recombination properties, which is critical to improve the accuracy.
Keywords :
elemental semiconductors; numerical analysis; point contacts; silicon; solar cells; surface recombination; Si; diffusion profiles; empirical models; injection dependence; open circuit voltages; point contact concentrator solar cell; recombination mechanisms reassessment; surface recombination velocity; three dimensional numerical model; Integrated circuit modeling; Numerical models; Photovoltaic cells; Photovoltaic systems; Silicon; Surface fitting; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317784
Filename :
6317784
Link To Document :
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