Title :
An energy efficient circuit level technique to protect register file from MBUs and SETs in embedded processors
Author :
Fazeli, M. ; Namazi, A. ; Miremadi, S.G.
Author_Institution :
Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
fDate :
June 29 2009-July 2 2009
Abstract :
This paper presents a circuit level soft error-tolerant-technique, called RRC (robust register caching), for the register file of embedded processors. The basic idea behind the RRC is to effectively cache the most vulnerable registers in a small highly robust register cache built by circuit level SEU and SET protected memory cells. To decide which cache entry should be replaced, the average number of read operations during a register ACE time is used as a criterion to judge. In fact, the victim cache entry is one which has the maximum read count. To minimize the power overhead of the RRC, the clock gating technique is efficiently exploited for the main register file resulting in significantly low power consumption. The RRC is able to protect the register file not only against single bit upsets (SBUs) but also against multiple bit upsets (MBUs) and single event transients (SETs). The RRC is experimentally evaluated using the LEON processor. The experimental results show that, if the cache size is selected properly, the architectural vulnerability factor (AVF) of the register file becomes about 1% while it imposes low power, area and performance overheads to the processor.
Keywords :
cache storage; circuit reliability; embedded systems; fault tolerance; low-power electronics; microprocessor chips; AVF; LEON processor; MBU; RRC; SET; architectural vulnerability factor; clock gating technique; embedded processor reliability; energy-efficient circuit level soft error-tolerant-technique; low-power consumption; memory cell protection; multiple bit upset; performance overhead; power overhead minimization; read operation; register file protection; robust register caching; single event transient; victim cache entry; Circuits; Embedded computing; Energy consumption; Energy efficiency; Error correction; Error correction codes; Protection; Registers; Robustness; Single event upset;
Conference_Titel :
Dependable Systems & Networks, 2009. DSN '09. IEEE/IFIP International Conference on
Conference_Location :
Lisbon
Print_ISBN :
978-1-4244-4422-9
Electronic_ISBN :
978-1-4244-4421-2
DOI :
10.1109/DSN.2009.5270337