• DocumentCode
    3516732
  • Title

    Evaluating the impact of Undetected Disk Errors in RAID systems

  • Author

    Rozier, Eric W D ; Belluomini, Wendy ; Deenadhayalan, Veera ; Hafner, Jim ; Rao, K.K. ; Zhou, Pin

  • Author_Institution
    IBM Almaden Res. Center, San Jose, CA, USA
  • fYear
    2009
  • fDate
    June 29 2009-July 2 2009
  • Firstpage
    83
  • Lastpage
    92
  • Abstract
    Despite the reliability of modern disks, recent studies have made it clear that a new class of faults, UndetectedDisk Errors (UDEs) also known as silent data corruption events, become a real challenge as storage capacity scales. While RAID systems have proven effective in protecting data from traditional disk failures, silent data corruption events remain a significant problem unaddressed by RAID. We present a fault model for UDEs, and a hybrid framework for simulating UDEs in large-scale systems. The framework combines a multi-resolution discrete event simulator with numerical solvers. Our implementation enables us to model arbitrary storage systems and workloads and estimate the rate of undetected data corruptions. We present results for several systems and workloads, from gigascale to petascale. These results indicate that corruption from UDEs is a significant problem in the absence of protection schemes and that such schemes dramatically decrease the rate of undetected data corruption.
  • Keywords
    RAID; discrete event simulation; system recovery; RAID system; arbitrary storage system; disk reliability; fault model; large-scale system; multiresolution discrete event simulator; silent data corruption event; storage capacity; undetected disk error; Analytical models; Computer errors; Discrete event simulation; Event detection; Fault detection; Large-scale systems; Numerical simulation; Protection; Switches; System testing; modeling; silent data corruption; simulation; undetected disk errors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems & Networks, 2009. DSN '09. IEEE/IFIP International Conference on
  • Conference_Location
    Lisbon
  • Print_ISBN
    978-1-4244-4422-9
  • Electronic_ISBN
    978-1-4244-4421-2
  • Type

    conf

  • DOI
    10.1109/DSN.2009.5270353
  • Filename
    5270353