• DocumentCode
    3516792
  • Title

    High-frequency vibration tests of Sn-Pb and lead-free solder joints

  • Author

    Di Maio, D. ; Hunt, C.P.

  • Author_Institution
    Nat. Phys. Lab., Teddington
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    819
  • Lastpage
    824
  • Abstract
    There are many applications in which electronics devices are subjected to vibration. Yet while there has been much research into the effects of low-cycle fatigue, there has been very little in the field of high-cycle fatigue, despite this being of interest in critical fields such as the aerospace industry. In consequence, this work has been aimed at studying lead-free solder alloys in a high-frequency environment, above 100 Hz, using SnPb alloy as a benchmark. Many previous studies on high-cycle fatigue have been focused on studying the effects on a full printed circuit board. That assessment method, however, is not suitable for characterising the solder performance, as the approach is geometry and condition specific. In this work therefore, a more general approach has been adopted, using a reproducible model solder joint as the sample to which well-controlled vibrations have been applied. This study highlighted the different behaviour of the various alloys when subjected to vibration, and in particular the superiority of the SnPb alloy, especially at higher frequencies. This method has been shown to be useful in characterising and ranking various materials, and tests could be easily repeated with a range of conditions, targeted at specific industrial applications. The method is versatile, and the equipment could easily be modified for testing at high temperatures.
  • Keywords
    dynamic testing; lead alloys; printed circuit testing; solders; tin alloys; Sn-Pb; high-cycle fatigue; printed circuit board; solder joints; vibration tests; Aerospace industry; Environmentally friendly manufacturing techniques; Fatigue; Frequency; Geometry; Lead; Materials testing; Printed circuits; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684457
  • Filename
    4684457