DocumentCode :
3516865
Title :
High precision Thick-Film load cell for dynamic force measurement
Author :
Crescini, Damiano ; Crescini, Paolo
Author_Institution :
Dept. of Inf. Eng. (DII), Univ. of Brescia, Brescia, Italy
fYear :
2012
fDate :
7-9 Feb. 2012
Firstpage :
1
Lastpage :
6
Abstract :
The application of load cells in industry generally requires good basic materials and accurate performance in a wide range of environments. Differences exist in manufacturing technologies, intended application, performance and cost; however, hysteresis, frequency response and creep can be a common source of errors in standard strain gauge cells. In this paper, we present a small structure based on piezoresistive effect, implemented in Thick-Film Technology (TFT) on 96% alumina substrate, working as load cell with high resonance frequency and low creep effects. The analytic model has been verified by using simulation based on finite element methods (FEM), resulting in satisfactory agreement. Based on a figure of merit (the product of the sensitivity and the square of the resonant frequency), optimized design rules are obtained for the sensors of various measure-ranges from 1 N to 10 N.
Keywords :
creep; finite element analysis; force measurement; frequency response; hysteresis; piezoresistive devices; resistors; strain gauges; FEM; alumina substrate; dynamic force measurement; finite element method; frequency response; high precision thick film load cell; high resonance frequency; hysteresis; low creep effects; optimized design rules; piezoresistive effect; strain gauge cells; Bridge circuits; Finite element methods; Sensitivity; Temperature measurement; Temperature sensors; Thin film transistors; figure-of-merit; load cell; piezoresistors; thick-film technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors Applications Symposium (SAS), 2012 IEEE
Conference_Location :
Brescia
Print_ISBN :
978-1-4577-1724-6
Type :
conf
DOI :
10.1109/SAS.2012.6166302
Filename :
6166302
Link To Document :
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