• DocumentCode
    3516924
  • Title

    Accurate 3D modelling and simulation of advanced packages and vertical stacked dice

  • Author

    Codreanu, Norocel ; Ionescu, Clara ; Svasta, Paul ; Plotog, Ioan ; Vulpe, Victor

  • Author_Institution
    Center for Technol. Electron. & Interconnection Tech., Politeh. Univ. of Bucharest, Bucharest
  • fYear
    2008
  • fDate
    1-4 Sept. 2008
  • Firstpage
    857
  • Lastpage
    862
  • Abstract
    In previous papers, the authors have investigated planar configurations existing in high-density interconnection (HDI) structures from the electromagnetic and signal integrity viewpoints (using 2.5D field solvers), offering solutions to signal integrity (SI) and electromagnetic compatibility (EMC) concerns . This paper presents new investigations and results focused on 3D modelling and simulation of advanced packages (SIP- system in package, SOP - system on package) and vertical stacked dice. A system-in-a-package or system in package, also known as a chip stack MCM, has a number of integrated circuits enclosed in a single package or module. The SIP performs all or most of the functions of an electronic system. System-on-package (SOP) is the new emerging system technology that goes beyond system-on-chip (SOC) and system-in-package (SIP) and forms the basis of all emerging digital convergent electronic and bio-electronic systems.
  • Keywords
    electromagnetic compatibility; multichip modules; packaging; system-on-chip; EMC; HDI; SI; SOC; SOP; advanced packages; electromagnetic compatibility; high-density interconnection; signal integrity; system-on-chip; system-on-package; vertical stacked dice; Circuit simulation; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic modeling; Electronics packaging; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit technology; Paper technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
  • Conference_Location
    Greenwich
  • Print_ISBN
    978-1-4244-2813-7
  • Electronic_ISBN
    978-1-4244-2814-4
  • Type

    conf

  • DOI
    10.1109/ESTC.2008.4684464
  • Filename
    4684464