• DocumentCode
    3516980
  • Title

    Examination of domain-reversed layers in Z-cut LiNbO3 using maker fringe analysis, atomic force microscopy, and high-resolution X-ray diffraction imaging

  • Author

    Aust, J.A. ; Steiner, B. ; Sanford, Norman A. ; Fogarty, G. ; yang, Bo ; Roshko, A. ; Amin, J. ; Evans, Colin

  • Author_Institution
    National Institute of Standards and Technology
  • Volume
    11
  • fYear
    1997
  • fDate
    18-23 May 1997
  • Firstpage
    485
  • Lastpage
    486
  • Keywords
    Apertures; Atomic force microscopy; Atomic layer deposition; Barium; Gratings; Image analysis; Laser excitation; Performance analysis; X-ray diffraction; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-4125-2
  • Type

    conf

  • DOI
    10.1109/CLEO.1997.603480
  • Filename
    603480
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3516980