Title :
Examination of domain-reversed layers in Z-cut LiNbO3 using maker fringe analysis, atomic force microscopy, and high-resolution X-ray diffraction imaging
Author :
Aust, J.A. ; Steiner, B. ; Sanford, Norman A. ; Fogarty, G. ; yang, Bo ; Roshko, A. ; Amin, J. ; Evans, Colin
Author_Institution :
National Institute of Standards and Technology
Keywords :
Apertures; Atomic force microscopy; Atomic layer deposition; Barium; Gratings; Image analysis; Laser excitation; Performance analysis; X-ray diffraction; X-ray imaging;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4125-2
DOI :
10.1109/CLEO.1997.603480
