DocumentCode
3517214
Title
A study of thermal, voltage, and photoinduced effects on the external quantum efficiency of CuInGaSe2 (CIGS) photovoltaic devices
Author
Feist, Rebekah ; Mills, Michael ; Thompson, R. Kirk ; Ramesh, Narayan
Author_Institution
Dow Solar, Dow Chem. Co., Midland, MI, USA
fYear
2012
fDate
3-8 June 2012
Abstract
The purpose of this study was to assess the performance of CuInGaSe2 (CIGS) solar cells ranging from 6.9-11.2% efficiency to identify means of improving device performance. One of the main drivers for this work was to take an independent look at elevated operating temperatures associated with BIPV products like Dow´s POWERHOUSE™ shingle system for performance differences as a function of system operating temperature independent of increasing efficiency to help future product definition. For three of the four samples we observed a clear lack of dark-light current-voltage (JV) superposition and correspondingly via external quantum efficiency (EQE) measurements an electrical field dependent carrier collection response in the blue regime. By inference this performance indicates the presence of impurities in the device, likely in the CdS film that could present an opportunity to further improve the CIGS device performance.
Keywords
building integrated photovoltaics; copper compounds; gallium compounds; indium compounds; semiconductor thin films; solar cells; ternary semiconductors; thermal analysis; BIPV products; CIGS solar cells; CdS; CuInGaSe2; Dow POWERHOUSE shingle system; EQE measurements; JV superposition; dark-light current-voltage superposition; efficiency 6.9 percent to 11.2 percent; electrical field dependent carrier collection response; external quantum efficiency; photoinduced effects; photovoltaic devices; thermal effect; voltage effect; Electric variables measurement; Indexes; Performance evaluation; Photovoltaic cells; RNA; USA Councils; CIGS; external quantum efficiency; photovoltaic cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location
Austin, TX
ISSN
0160-8371
Print_ISBN
978-1-4673-0064-3
Type
conf
DOI
10.1109/PVSC.2012.6317832
Filename
6317832
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