Title :
Risk mitigation framework for a robust design process
Author :
Narania, S. ; Eshahawi, T. ; Gindy, N. ; Tang, Y.K. ; Stoyanov, Stoyan ; Ridout, Stephen ; Bailey, Chris
Author_Institution :
Sch. of Mech. Mater. & Manuf. Eng., Univ. of Nottingham, Nottingham
Abstract :
The increasing complexity of new manufacturing processes and the continuously growing range of fabrication options mean that critical decisions about the insertion of new technologies must be made as early as possible in the design process. Mitigating the technology risks under limited knowledge is a key factor and major requirement to secure a successful development of the new technologies. In order to address this challenge, a risk mitigation methodology that incorporates both qualitative and quantitative analysis is required. This paper outlines the methodology being developed under a major UK grand challenge project - 3D-Mintegration. The main focus is on identifying the risks through identification of the product key characteristics using a product breakdown approach. The assessment of the identified risks uses quantification and prioritisation techniques to evaluate and rank the risks. Traditional statistical process control based on process capability and six sigma concepts are applied to measure the process capability as a result of the risks that have been identified. This paper also details a numerical approach that can be used to undertake risk analysis. This methodology is based on computational framework where modelling and statistical techniques are integrated. Also, an example of modeling and simulation technique is given using focused ion beam which is among the investigated in the project manufacturing processes.
Keywords :
manufacturing systems; risk analysis; six sigma (quality); statistical process control; focused ion beam; product breakdown approach; qualitative analysis; quantitative analysis; risk mitigation framework; robust design process; six sigma concepts; statistical process control; Computational modeling; Electric breakdown; Fabrication; Ion beams; Manufacturing processes; Process control; Process design; Risk analysis; Robustness; Six sigma;
Conference_Titel :
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location :
Greenwich
Print_ISBN :
978-1-4244-2813-7
Electronic_ISBN :
978-1-4244-2814-4
DOI :
10.1109/ESTC.2008.4684501