DocumentCode :
3517605
Title :
Arc-fault detector algorithm evaluation method utilizing prerecorded arcing signatures
Author :
Johnson, Jay ; Kang, Jack
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
The 2011 National Electrical Code® Article 690.11 requires photovoltaic systems on or penetrating a building to include a DC arc-fault protection device. In order to satisfy this requirement, new Arc-Fault Detectors (AFDs) are being developed by multiple manufacturers including Sensata Technologies. Arc-fault detection algorithms often utilize the AC noise on the PV string to determine when arcing conditions exist in the DC system. In order to accelerate the development and testing of Sensata Technologies´ arc-fault detection algorithm, Sandia National Laboratories (SNL) provided a number of data sets. These prerecorded 10 MHz baseline and arc-fault data sets included different inverter and arc-fault noise signatures. Sensata Technologies created a data evaluation method focused on regeneration of the prerecorded arcing and baseline test data with an arbitrary function generator, thereby reducing AFD development time.
Keywords :
arcs (electric); invertors; photovoltaic power systems; power generation faults; power generation protection; AC noise; AFD; AFD development time reduction; DC arc-fault protection device; PV string; SNL; Sandia National Laboratories; Sensata technologies; arbitrary function generator; arc-fault data sets; arc-fault detector algorithm evaluation method; arc-fault noise signatures; baseline data sets; baseline test data regeneration; data evaluation method; frequency 10 MHz; inverter; photovoltaic systems; prerecorded arcing data regeneration; prerecorded arcing signatures; Abstracts; Circuit faults; Indexes; Inverters; Noise; Oscilloscopes; Switches; arc-fault detection; monitoring; photovoltaic systems; power system safety; series arc-faults;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317856
Filename :
6317856
Link To Document :
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