Title :
1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345)
Abstract :
The following topics were dealt with: analogue circuits and techniques; high-speed circuits; digital circuits; floating body effects; reliability; and defect characterization
Keywords :
analogue integrated circuits; digital integrated circuits; high-speed integrated circuits; integrated circuit reliability; silicon-on-insulator; analogue circuits; defect characterization; digital circuits; floating body effects; high-speed circuits; reliability;
Conference_Titel :
SOI Conference, 1999. Proceedings. 1999 IEEE International
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5456-7
DOI :
10.1109/SOI.1999.819827
