DocumentCode
3517896
Title
1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345)
fYear
1999
fDate
4-7 Oct. 1999
Abstract
The following topics were dealt with: analogue circuits and techniques; high-speed circuits; digital circuits; floating body effects; reliability; and defect characterization
Keywords
analogue integrated circuits; digital integrated circuits; high-speed integrated circuits; integrated circuit reliability; silicon-on-insulator; analogue circuits; defect characterization; digital circuits; floating body effects; high-speed circuits; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1999. Proceedings. 1999 IEEE International
Conference_Location
Rohnert Park, CA, USA
ISSN
1078-621X
Print_ISBN
0-7803-5456-7
Type
conf
DOI
10.1109/SOI.1999.819827
Filename
819827
Link To Document