DocumentCode :
3517913
Title :
Microarray classification using block diagonal linear discriminant analysis with embedded feature selection
Author :
Sheng, Lingyan ; Pique-Regi, Roger ; Asgharzadeh, Shahab ; Ortega, Antonio
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA
fYear :
2009
fDate :
19-24 April 2009
Firstpage :
1757
Lastpage :
1760
Abstract :
In this paper, block diagonal linear discriminant analysis (BDLDA) is improved and applied to gene expression data. BDLDA is a classification tool with embedded feature selection, that has demonstrated good performance on simulated data. However, by using cross validation in training, BDLDA is time consuming, thus not an appropriate algorithm for gene expression data, which has a large number of features and relatively small number of samples. In our algorithm, estimated error rate is used as a measure to choose the best model. The algorithm is optimized by repeating the model construction procedure with previously selected features removed, which leads to increased classification robustness. Our algorithm is tested using 10 fold cross validation. In most simulated and real data, our method outperforms the state-of-the-art techniques, showing promise for its use in microarray classification problems. The resulting block structure allows to identify discriminating correlated genes, which is potentially useful in cancer research.
Keywords :
bioinformatics; covariance matrices; pattern classification; statistical analysis; block diagonal linear discriminant analysis; covariance matrix; cross validation; embedded feature selection; estimated error rate; gene expression data; microarray classification; Cancer; Covariance matrix; Data engineering; Error analysis; Gene expression; Image processing; Linear discriminant analysis; Pediatrics; Signal processing; Viterbi algorithm; Block Diagonal; Feature Selection; LDA; Microarray;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing, 2009. ICASSP 2009. IEEE International Conference on
Conference_Location :
Taipei
ISSN :
1520-6149
Print_ISBN :
978-1-4244-2353-8
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2009.4959944
Filename :
4959944
Link To Document :
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