Title :
Toward ultra thin CIGS solar cells
Author :
Marsillac, Sylvain ; Ranjan, Vikash ; Aryal, Krishna ; Little, Scott ; Erkaya, Yunus ; Rajan, Grace ; Boland, Patrick ; Attygalle, Dinesh ; Aryal, Puruswottam ; Pradhan, Puja ; Collins, Robert W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norlfolk, VA, USA
Abstract :
In this paper, we present our results on the fabrication of solar cells down to thicknesses of 0.5 μm, and how real time and in situ analysis by spectroscopic ellipsometry (SE) can help in (i) understanding the results of the devices; and (ii) modeling the growth and properties of the CIGS solar cell. These in situ and real time measurements are correlated with ex situ structural measurements of the films such as XRD and AFM; broad spectral range optical measurements of the films and devices such as T&R, variable angle SE; and device specific measurements such as I-V and QE measurements.
Keywords :
X-ray diffraction; atomic force microscopy; solar cells; thin film devices; AFM; I-V measurements; QE measurements; XRD; broad spectral range optical measurements; ex situ structural measurements; in situ measurements; real time measurements; size 0.5 mum; solar cell fabrication; spectroscopic ellipsometry; ultrathin CIGS solar cells; Dielectric measurements; Indium; Nickel; Optical device fabrication; Optical materials; Photonic band gap; photovoltaic cells; spectroscopic ellipsometry; thin film devices;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317878
