Title :
The interface between different types of thick film layers
Author :
Pelikánová, Ivana Beshajová
Author_Institution :
Dept. of Electrotechnol., CTU in Prague, Prague, Czech Republic
Abstract :
The investigation of conductive and resistive layers interface is topic of the work. Layers of measured structure were deposited by screen-printing of polymer pastes. The measured structure consists of contact area with different geometry. Contact resistance of interface between conductive and resistive layers was measured as a parameter of quality. The three-wire method was used for measurement. Experimental results were analyzed in the context of contacts geometry and frequency of powered signal.
Keywords :
contact resistance; interface structure; polymers; printed circuits; thick film circuits; conductive layer interface; contact area; contact geometry; contact resistance; polymer pastes; printed circuit board; resistive layer interface; screen printing; thick film layer; three-wire method; Area measurement; Contact resistance; Current measurement; Electrical resistance measurement; Resistance; Thick films; Voltage measurement;
Conference_Titel :
Electronics Technology (ISSE), 2010 33rd International Spring Seminar on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4244-7849-1
Electronic_ISBN :
978-1-4244-7850-7
DOI :
10.1109/ISSE.2010.5547257
