DocumentCode
3518081
Title
Circuits with innovative devices - challenges and chances
Author
Schmitt-Landsiedel, D. ; Werner, C.
Author_Institution
Inst. for Tech. Electron., Tech. Univ. of Munich, Munich
fYear
2008
fDate
12-14 March 2008
Firstpage
81
Lastpage
84
Abstract
MOS devices go 3D and new field effect devices appear in the research labs. The talk will regard implications of modified device architectures on established circuit design, showing examples of circuits with multi-gate-FETs and tunneling field effect transistors. The potential of more substantial paradigm changes in circuit design for novel devices was also discussed.
Keywords
MOSFET; integrated circuit design; MOS devices; circuit design; modified device architectures; multigate-FET; tunneling field effect transistors; CMOS digital integrated circuits; CMOS technology; Circuit synthesis; Degradation; Digital circuits; FETs; Inverters; MOSFET circuits; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultimate Integration of Silicon, 2008. ULIS 2008. 9th International Conference on
Conference_Location
Udine
Print_ISBN
978-1-4244-1729-2
Electronic_ISBN
978-1-4244-1730-8
Type
conf
DOI
10.1109/ULIS.2008.4527145
Filename
4527145
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