DocumentCode :
3518100
Title :
A New Compact SRAM Cell by Vertical MOSFET for Low-Power and Stable Operation
Author :
Na, Hyoungjun ; Endoh, Tetsuo
Author_Institution :
Center for Interdiscipl. Res., Tohoku Univ., Sendai, Japan
fYear :
2011
fDate :
22-25 May 2011
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a compact SRAM cell with low-power and stable operation is proposed using vertical MOSFET technology, and its impact on the cell size and the performance is examined. Although the proposed SRAM cell is composed of 12 transistors, it has a small cell size, which is only 74% of the conventional 8T-SRAM cell, because of its stacked vertical MOSFET structure. The proposed SRAM cell with vertical MOSFET realizes a reduced power dissipation during the write operation which is 47% and 44% of the conventional 6T and 8T SRAM cell, respectively. Furthermore, the proposed SRAM cell with vertical MOSFET has achieved 3 times larger write and read Static Noise Margin (SNM) than that of the conventional planar 6T or 8T-SRAM cell, and its SNM is more tolerant against threshold voltage (Vth) fluctuation.
Keywords :
MOSFET; SRAM chips; low-power electronics; SNM; Vth fluctuation; compact SRAM Cell; low-power operation; stable operation; static noise margin; threshold voltage fluctuation; vertical MOSFET technology; Computer architecture; Fluctuations; MOSFET circuits; Microprocessors; Power dissipation; Power supplies; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Workshop (IMW), 2011 3rd IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4577-0225-9
Electronic_ISBN :
978-1-4577-0224-2
Type :
conf
DOI :
10.1109/IMW.2011.5873204
Filename :
5873204
Link To Document :
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