DocumentCode
3518108
Title
Development and investigation of horizontal elements in 3D micro-contacts and structures
Author
Andreev, Svetozar ; Arnaudo, Radosvet ; Andonova, Anna ; Kafadarova, Nadezhda ; Videkov, Valentin
Author_Institution
Dept. of Microelectron., Tech. Univ. Sofia, Sofia
fYear
2008
fDate
1-4 Sept. 2008
Firstpage
1285
Lastpage
1290
Abstract
The present article describes the development and production of horizontal elements in 3D micro-contacts, implemented in IC package to PCB assembly and micro mechanical actuators. Instead of the standard vacuum deposition of metal films onto dielectric interfaces and lift-off stripping, an alternative method aiming at simplicity and lower-cost, relative to the technology roadmap is proposed. This method employs chemical activation and pre-treatment of the dielectric photoresist surfaces with fluid carbon content substance, thus providing also electrical conductivity for direct metal electroplating. A special regime of reverse electrochemical deposition is applied in order to enhance the adhesion of the layer, deposited onto the activated surface. This paper presents experimental results of the horizontal elements investigation, relative to the 3D micro-contacts. Thermal simulations of the proposed structures are also included. This issue is of a great importance, due to the nature of the horizontal elements - actuator type and bending features.
Keywords
electrical conductivity; electrodeposition; electroplating; micromechanical devices; photoresists; 3D micro-contacts; IC package; PCB assembly; chemical activation; dielectric photoresist surfaces; direct metal electroplating; electrical conductivity; electrochemical deposition; fluid carbon content substance; horizontal elements; micro mechanical actuators; Actuators; Assembly; Chemical elements; Chemical technology; Conductivity; Dielectric films; Integrated circuit packaging; Production; Resists; Vacuum technology; Micro-contacts; UV-LIGA; actuators; chemical surface activation; horizontal elements; selective electrochemical growth; studs; thermal simulations;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location
Greenwich
Print_ISBN
978-1-4244-2813-7
Electronic_ISBN
978-1-4244-2814-4
Type
conf
DOI
10.1109/ESTC.2008.4684539
Filename
4684539
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