• DocumentCode
    3518237
  • Title

    Spontaneous symmetry breaking in the optimization of subwavelength solar cell textures for light trapping

  • Author

    Ganapati, Vidya ; Miller, Owen D. ; Yablonovitch, Eli

  • Author_Institution
    Univ. of California, Berkeley, Berkeley, CA, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Light trapping in solar cells allows for increased efficiency and reduced materials cost. It is well known that a 4n2 factor of enhancement in absorption can be achieved by randomly texturing the surface of the solar cell, where n is the refractive index of the material. However, this limit only holds when the thickness of the solar cell is much greater than the wavelength of light. In the subwavelength regime, the fundamental question remains unanswered: what surface texture realizes the optimal absorption enhancement? We turn to computational inverse electromagnetic design in order to find this optimal nanoscale texture for light trapping, and observe spontaneous symmetry breaking in the final design. We achieve a factor of 40 in enhancement at normal incidence and above 20 for angle-averaged incidence (averaged over an energy bandwidth of 1/8) for n= 3.5.
  • Keywords
    computational electromagnetics; refractive index; solar cells; surface texture; angle-averaged incidence; computational inverse electromagnetic design; light trapping; optimal absorption enhancement; optimal nanoscale texture; refractive index; spontaneous symmetry breaking; subwavelength solar cell texture optimization; surface texture; Absorption; Charge carrier processes; Materials; Optical surface waves; Optimization; Photovoltaic cells; Surface texture; absorptivity; light trapping; photovoltaics; solar cells; subwavelength; surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317894
  • Filename
    6317894