DocumentCode :
351847
Title :
Probe station testing of large area silicon drift detectors
Author :
Asmus, A. ; Bellwied, R. ; Beuttenmulle, R. ; Chen, W. ; Dyke, H. ; Eremin, V. ; Fiske, D.R. ; Hoffmann, G.W. ; Humanic, T.J. ; Grau, M. ; Ilyashenko, I. ; Kotov, I.V. ; Kraner, H.W. ; Leonhardt, B. ; Li, Z. ; Lynn, D. ; Pandey, S.U. ; Schambach, J. ; Sed
Author_Institution :
STAR-SVT Collaboration, Ohio State Univ., Columbus, OH, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
316
Abstract :
Probe stations for STAR Silicon Drift Detectors testing were developed and built at BNL and Ohio State University. A throughput of a wafer per day per probe station was reached. Testing procedure and probe station design criteria are discussed
Keywords :
semiconductor device testing; silicon radiation detectors; STAR Silicon Drift Detectors; Si; large area Si drift detectors; probe station design criteria; probe station testing; Anodes; Cathodes; Detectors; Electrodes; Electrons; Probes; Silicon; Strips; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
ISSN :
1082-3654
Print_ISBN :
0-7803-5696-9
Type :
conf
DOI :
10.1109/NSSMIC.1999.842500
Filename :
842500
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=351847
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