Title :
Optimal double-gate MOSFETs: symmetrical or asymmetrical gates?
Author :
Keunwoo Kim ; Fossum, J.G.
Author_Institution :
Florida Univ., Gainesville, FL, USA
Abstract :
Due to their near-ideal intrinsic features, double-gate (DG) MOSFETs (with thin, fully depleted (FD) Si-film (SOI) bodies) are of interest for possible future CMOS IC applications with L/sub eff/ approaching the lateral scaling limit (/spl sim/20 nm) (Fossum and Chong, 1998; Wong et al. 1998). Much of this interest stems from the two-channel property of the symmetrical-gate DG device and the implied higher current drive. More important, we believe, is the electrical coupling of the two gates through the FD Si film. This coupling underlies the inherent suppression of SCEs and the excellent subthreshold slope, which translate to high I/sub on//I/sub off/ ratios. In fact, as we show in this paper, the coupling can be exploited more in asymmetrical-gate DG MOSFETs (Fossum and Chong, 1998; Tanaka et al. 1994) than in symmetrical ones. We rely on numerical device simulations, using MEDICI and its hydrodynamic-transport option, and SOISPICE circuit simulations, using the UFSOI/FD MOSFET model (Fossum et al. 1998), to convey insight regarding performance and optimal design of DG MOSFETs and to reveal the inherent superiority of asymmetrical gates.
Keywords :
CMOS integrated circuits; MOSFET; SPICE; electric current; numerical analysis; semiconductor device models; silicon-on-insulator; 20 nm; CMOS IC applications; FD Si film; MEDICI; SCE suppression; SOISPICE circuit simulation; Si-SiO/sub 2/; UFSOI/FD MOSFET model; asymmetrical gates; asymmetrical-gate DG MOSFETs; current drive; double-gate MOSFETs; effective channel length; electrical coupling; fully depleted SOI bodies; fully depleted Si-film bodies; hydrodynamic-transport option; lateral scaling limit; near-ideal intrinsic features; numerical device simulation; on/off current ratios; optimal design; subthreshold slope; symmetrical gates; symmetrical-gate DG MOSFETs; symmetrical-gate DG device; two-channel property; Application specific integrated circuits; CMOS integrated circuits; Circuit simulation; Couplings; Doping; MOSFETs; Medical simulation; Semiconductor films; Surface resistance; Threshold voltage;
Conference_Titel :
SOI Conference, 1999. Proceedings. 1999 IEEE International
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5456-7
DOI :
10.1109/SOI.1999.819871