Total dose test of commercial off-the-shelf components to be used in power supply for space experiments

Author

Menichelli, M. ; Battiston, R. ; Bizzaglia, S. ; Blasko, S. ; Castellini, G. ; Masso, L. Di ; Gabbanini, M. ; Papi, A. ; Scolieri, G. ; Tesi, A.

Author_Institution

Dept. of Phys., Ist. Nazionale di Fisica Nucl., Perugia, Italy

Volume

1

fYear

1999

fDate

1999

Firstpage

408

Abstract

Commercial off-the-shelf components have been tested for their use on the power supplies of the AMS and PAMELA experiments. The test has been performed using the CALLIOPE Co60 source at the Casaccia (Rome-Italy) Laboratory of ENEA according to the ESA/SCC 22900 specifications. The total dose for this test: was 30 krads. Measurements of relevant parameters for each component has been taken at 3, 10 and 30 krads. Annealing and ageing has also been performed according to the ESA specification. The results on the degradation of performances in discrete transistors, op amps, regulators and other analog and digital components are reported

Keywords

aerospace testing; ageing; annealing; power semiconductor devices; radiation hardening (electronics); semiconductor device measurement; semiconductor device testing; space vehicle power plants; 10 krad; 3 krad; 30 krad; AMS experiment; ESA/SCC 22900 specifications; PAMELA experiment; ageing; analog components; annealing; commercial off-the-shelf components; digital components; op amps; performance degradation; radiation dose tests; regulators; space experiments; space power supply; transistors; Aging; Annealing; Circuit testing; Laboratories; Operational amplifiers; Performance evaluation; Power supplies; Regulators; Space stations; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE

Conference_Location

Seattle, WA

ISSN

1082-3654

Print_ISBN

0-7803-5696-9

Type

conf

DOI

10.1109/NSSMIC.1999.842518

Filename

842518