DocumentCode
3518597
Title
Demonstration of CAM and TCAM Using Phase Change Devices
Author
Rajendran, Bipin ; Cheek, Roger W. ; Lastras, Luis A. ; Franceschini, Michele M. ; Breitwisch, Matthew J. ; Schrott, Alejandro G. ; Li, Jing ; Montoye, Robert K. ; Chang, Leland ; Lam, Chung
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2011
fDate
22-25 May 2011
Firstpage
1
Lastpage
4
Abstract
We demonstrate novel designs for Content Addressable Memory (CAM) and Ternary CAM (TCAM) using Phase Change Memory (PCM) technology, which can potentially improve density and power consumption by >;5X as compared with conventional SRAM based implementations. Using Monte-Carlo simulations, we also predict the desired characteristics of PCM devices for realizing large, high performance CAM/TCAM chips.
Keywords
Monte Carlo methods; content-addressable storage; phase change memories; Monte-Carlo simulation; PCM decives; SRAM; TCAM; content addressable memory; phase change devices; phase change memory technology; ternary CAM; Arrays; Computer aided manufacturing; FETs; Phase change materials; Programming; Resistance; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Workshop (IMW), 2011 3rd IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4577-0225-9
Electronic_ISBN
978-1-4577-0224-2
Type
conf
DOI
10.1109/IMW.2011.5873229
Filename
5873229
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