Title :
Device simulation of intermediate band solar cells: Dependence on number of intermediate band layers
Author :
Yoshida, Katsuhisa ; Okada, Yoshitaka ; Sano, Nobuyuki
Abstract :
Intermediate band solar cell (IBSC) is a concept to achieve a higher conversion efficiency than the Shockley-Queisser limit of a single junction cell. Current-voltage characteristics of multi-stacked quantum dot solar cells for the application for IBSCs show a clear dependence on the quantum dot stacking layer numbers. Increasing the number of stacking layers, short-circuit current density is increased but open-circuit voltage is reduced compared with a control cell. We studied the dependence of IB layer numbers on IBSC performance by using self-consistent drift-diffusion method for IBSCs with localized IB in IB region. Our results show the similar dependence of current-voltage characteristics for experimental results under 1 sun illumination. Under 1000 suns, the degradation of open-circuit voltage is reduced and the net carrier generation rate is well controlled by incident photon flux densities. As a result, to evaluate the potential of multi-stacked quantum dot solar cells for IBSC operations, assessments of the inclement of short-circuit current densities under low concentration and the change of open-circuit voltages under high concentration are important.
Keywords :
current density; quantum dots; short-circuit currents; solar cells; IBSC performance; Shockley-Queisser limit; current-voltage characteristics; device simulation; higher conversion efficiency; incident photon flux density; intermediate band layer; intermediate band solar cell; multistacked quantum dot solar cell; net carrier generation rate; open-circuit voltage; quantum dot stacking layer number; self consistent drift-diffusion method; short-circuit current density; single junction cell; Absorption; Electric potential; Lighting; Photonics; Photovoltaic cells; Physics; Voltage control; photovoltaic cells; semiconductor device model;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317916