DocumentCode
3518607
Title
Processing and properties of Cu-base and Co-base amorphous wires
Author
Liao, W.B. ; Zhang, Y.
Author_Institution
State Key Lab. for Adv. Metals & Mater., Univ. of Sci. & Technol. Beijing, Beijing, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
906
Lastpage
908
Abstract
Amorphous wires of CuZrAl and CoFeSiB alloys were fabricated by in-rotating-water melt quenching (IMQ) and glass coated Taylor (GCT) techniques, and the diameters of the amorphous wires prepared by the IMQ are in the range of about 50 to 200 mum, while by the GCT are in the range f about 5 to 18 mum. The stress-strain curves of the Cu50Zr46Al4 amorphous wire show a nonlinear deformation after the elastic deformation, and the tensile strength is about 1800 MPa. The resistivity of the CoFeSiB amorphous wires exhibit no obvious size effect in the diameter range of 5 to 18 mum, the resistivity decreases after the annealing at 600degC.
Keywords
annealing; boron alloys; cobalt alloys; copper compounds; iron alloys; materials preparation; quenching (thermal); silicon alloys; zirconium compounds; CoFeSiB; CuZrAl; amorphous wires; annealing; elastic deformation; glass coated Taylor techniques; in-rotating-water melt quenching; nonlinear deformation; temperature 600 C; tensile strength; Aluminum alloys; Amorphous materials; Cobalt alloys; Conductivity; Copper alloys; Glass; Scanning electron microscopy; Surface cracks; Surface morphology; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270553
Filename
5270553
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