• DocumentCode
    3518610
  • Title

    Economic reliability test methods of new soldering materials

  • Author

    Niedzwiedz, Wojciech ; Szwech, Marcin ; Chmielewski, Jacek ; Drozd, Zdzislaw

  • Author_Institution
    Div. of Precision & Electron. Product Technol., Warsaw Univ. of Technol., Warsaw, Poland
  • fYear
    2010
  • fDate
    12-16 May 2010
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    According to RoHS directive, many new electronic products are manufactured by using of new technology and lead-free soldering materials. For reduction of the risks concerning quality and reliability of such products are necessary accurate investigations. Reliability tests of electronic interconnections are time consuming and expensive. In Reliability Laboratory of Warsaw University of Technology (WUT) are studied different test methods and optimal method, applicable by small producers of electronic equipment, is searched. In this paper are presented last results of mechanical shearing test method and compared with applied before thermal cycling and mechanical flexion methods. The application area of each method is discussed. These results show that the test time and costs can be drastically reduced by application of mechanical methods. The goal of performed research is preparation of the proposal for standardization.
  • Keywords
    RoHS compliance; electronic equipment testing; electronic products; fatigue testing; reliability; shearing; soldering; RoHS directive; economic reliability test methods; electronic equipment; electronic interconnection reliability tests; electronic products; lead-free soldering materials; mechanical flexion methods; mechanical shearing test method; soldering materials; thermal cycling; Fatigue; Life estimation; Reliability; Shearing; Soldering; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2010 33rd International Spring Seminar on
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4244-7849-1
  • Electronic_ISBN
    978-1-4244-7850-7
  • Type

    conf

  • DOI
    10.1109/ISSE.2010.5547300
  • Filename
    5547300