Title :
Computer simulations and performance measurements on a silicon strip detector for edge-on imaging
Author :
Lundqvist, M. ; Cederstrom, B. ; Chmill, V. ; Danielsson, M. ; Nygren, D.
Author_Institution :
Dept. of Phys., R. Inst. of Technol., Stockholm, Sweden
Abstract :
Silicon strip detectors to be used edge-on for imaging in a scanned slit geometry have been simulated. A software program was developed which can simulate the motion of free charges in the bulk detector and calculate the signals they induce on the electrodes. The purpose was to quantify the impact of charge sharing on system detective quantum efficiency (DQE). The energy spectrum that was used in this study is typical for mammography. The detectors are working in single photon counting mode and the optimal threshold level to discriminate noise from useful signals has been calculated. The loss in detective quantum efficiency due to charge sharing was found to be around 5% for a 100 μm pitch detector. Coincidence circuits can be included in the electronics to eliminate this problem. Furthermore, it is described how the relationship between charge collection efficiency and photon interaction position in the detector can be measured
Keywords :
diagnostic radiography; digital simulation; mammography; silicon radiation detectors; 100 micron; Si; Si strip detector; charge collection efficiency; charge sharing; coincidence circuits; computer simulation; detective quantum efficiency; edge-on imaging; mammography; photon interaction position; scanned slit geometry; single photon counting; Computational modeling; Computer simulation; Detectors; Geometry; Image edge detection; Measurement; Motion detection; Silicon; Solid modeling; Strips;
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5696-9
DOI :
10.1109/NSSMIC.1999.842522
