The DEPFET pixel BIOSCOPE

Author

Neeser, W. ; Böcker, M. ; Buchholz, P. ; Fischer, P. ; Holl, P. ; Kemmer, J. ; Klein, P. ; Koch, H. ; Löcker, M. ; Lutz, G. ; Matthäy, H. ; Strüder, L. ; Trimpl, M. ; Ulrici, J. ; Wermes, N.

Author_Institution

Phys. Inst., Bonn Univ., Germany

Volume

1

fYear

1999

fDate

1999

Firstpage

443

Abstract

The DEPFET pixel Bioscope system based on a DEPFET pixel matrix provides good spatial and energy resolution in real-time digital autoradiography. Due to its very low noise and an optimized entrance window the online detection of tritium without vacuum or cooling is demonstrated for the first time. To achieve this milestone a p-channel junction field effect transistor on a fully depleted high ohmic silicon substrate (DEPFET) is used as unit cell for pixel detectors providing an excellent noise performance of 158 eV FWHM at 6 keV (12 e ENC) at room temperature (300 K). 64×64 DEPFET pixel matrices with square (50 μm×50 μm) or hexagonal (50 μm×42 μm) pixels have been developed and operated successfully. First measurements result in a homogeneous charge collection efficiency on the whole matrix area and a good linearity in the X-ray range from 5 keV to 60 keV. First images taken with the square and the hexagonal pixel matrices using an ⁵⁵Fe-source as well as a “proof of principle” experiment for online ³H-detection are presented and discussed

Keywords

biological techniques; field effect transistors; image resolution; radioisotope imaging; 158 keV; 300 K; 50 mum; 6 keV; ⁵⁵Fe-source; DEPFET pixel BIOSCOPE; DEPFET pixel matrix; Fe; H; Si; energy resolution; fully depleted high ohmic silicon substrate; homogeneous charge collection efficiency; noise performance; online ³H-detection; p-channel junction field effect transistor; real-time digital autoradiography; spatial resolution; Area measurement; Charge measurement; Cooling; Current measurement; Detectors; Energy resolution; FETs; Real time systems; Silicon; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE

Conference_Location

Seattle, WA

ISSN

1082-3654

Print_ISBN

0-7803-5696-9

Type

conf

DOI

10.1109/NSSMIC.1999.842524

Filename

842524