• DocumentCode
    3518659
  • Title

    A methodology for optimization of false call rate in automated optical inspection post reflow

  • Author

    Soukup, Radek

  • Author_Institution
    Dept. of Technol. & Meas., Univ. of West Bohemia, Pilsen, Czech Republic
  • fYear
    2010
  • fDate
    12-16 May 2010
  • Firstpage
    263
  • Lastpage
    267
  • Abstract
    In this paper a methodology for optimization of false call rate in automated optical inspection post reflow is presented. The Automated optical inspection (AOI) of assembled PCB´s is one of the most widely spread non-destructive testing method. It helps to ensure that defects created while the printed circuit board assembly is being manufactured are discovered before the product is shipped to final customer. The issue of false calls has become one of the keys to unlocking the potential of AOI. One primary goal has been that AOI is used most effectively as a feedback tool for yield improvement The presented methodology was introduced into 8 automotive electronics industry projects, where the false call rate was reduced by 56% in 10 months after its implementation. The methodology includes activities such as AOI inspection window optimization, AOI metrics definition, and design guideline for AOI in development (layout, HW and mech. design), bending of panels (warpage) prevention, set optical variation criteria. False call rate can be also dramatically reduced by introducing of 24 bits true color instead of 8 bits grayscale image processing.
  • Keywords
    assembling; automatic optical inspection; circuit optimisation; nondestructive testing; printed circuit manufacture; printed circuit testing; assembled PCB; automated optical inspection post reflow; automotive electronics industry projects; false call rate optimization; feedback tool; grayscale image processing; nondestructive testing method; panel prevention bending; printed circuit board assembly; set optical variation criteria; Adaptive optics; Automatic optical inspection; Image color analysis; Optical feedback; Optical imaging; Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2010 33rd International Spring Seminar on
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4244-7849-1
  • Electronic_ISBN
    978-1-4244-7850-7
  • Type

    conf

  • DOI
    10.1109/ISSE.2010.5547304
  • Filename
    5547304