DocumentCode :
351868
Title :
Effects of mechanical alignment errors on Compton scatter imaging
Author :
Du, Y.E. ; He, Z. ; Knoll, G.E. ; Wehe, D.K.
Author_Institution :
Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
473
Abstract :
The development of a prototype Compton scattering camera based on two 1 cm3 cubic 3-D position sensitive CZT detectors is underway in our laboratory. As a practical problem, the mechanical alignment error may be larger than the 1 mm detector position resolution. This paper investigates the effects of any possible mechanical alignment error on the reconstructed images by Monte Carlo simulations. Our simulation results show that a minor misalignment can cause a significant distortion in the reconstructed image. Any alignment error will lead to a systematic error if the mechanical misalignment is not compensated for. Since the alignment error can cause a distinguishable distortion, system parameters can be adjusted during the image reconstruction procedure until an optimal image is obtained. In this manner, the mechanical alignment error can be automatically determined and compensated for. Our results indicate that any distortion due to alignment error can be eliminated and ensure the angular resolution remains only limited by the two detectors energy and position resolutions
Keywords :
Compton effect; calibration; measurement errors; position control; position sensitive particle detectors; semiconductor counters; 1 mm; CZT detectors; CdZnTe; Compton scatter imaging; Compton scattering camera; Monte Carlo simulation; angular resolution; energy resolution; image reconstruction; mechanical alignment errors; position resolution; systematic error; Anodes; Cameras; Electromagnetic scattering; Energy resolution; Image reconstruction; Particle scattering; Position sensitive particle detectors; Prototypes; Radiation detectors; Solid scintillation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
ISSN :
1082-3654
Print_ISBN :
0-7803-5696-9
Type :
conf
DOI :
10.1109/NSSMIC.1999.842530
Filename :
842530
Link To Document :
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