Title :
High resolution CdZnTe pixel detectors with VLSI readout
Author :
Cook, Walter R. ; Boggs, Steven E. ; Bolotnikov, Aleksey E. ; Burnham, Jill A. ; Fitzsimmons, Michael J. ; Harrison, Fiona A. ; Kecman, Branislav ; Matthews, Brian ; Schindler, Stephen M.
Author_Institution :
California Inst. of Technol., Pasadena, CA, USA
Abstract :
CdZnTe pixel detectors with a custom VLSI readout, are being developed at Caltech/JPL for use in focusing hard X-ray telescopes. We have recently tested several prototype detector assemblies, each consisting of a 2 mm thick CdZnTe pixel detector indium bump bonded to our VLSI readout chip. A complete pulse height analysis chain is located directly below each 680 by 650 μm pixel and includes a preamplifier, shaping amplifiers, and a peak stretcher/discriminator. Here we report on the first fully functional operation of these detector/VLSI hybrids. Using an Am241 source, collimated to illuminate a single pixel, excellent energy resolution of 670 eV FWHM was measured for the 59.5 keV-line at -10 C, with electronic noise of only 340 eV FWHM. Illumination with an uncollimated source was performed to assess the uniformity of pixel response and to exercise the readout chip´s ability to process multiple pixel events arising from X-rays interacting above pixel boundaries. The imaging capability of the detector was demonstrated using a tungsten slit mask
Keywords :
VLSI; X-ray astronomy; cadmium compounds; nuclear electronics; preamplifiers; pulse shaping circuits; readout electronics; semiconductor counters; 241Am source; Am241 source; Cd-Zn-Te; VLSI readout; electronic noise; energy resolution; hard X-ray telescopes; high resolution CdZnTe pixel detectors; imaging capability; multiple pixel events; peak stretcher/discriminator; pixel response; preamplifier; pulse height analysis chain; shaping amplifiers; tungsten slit mask; Assembly; Focusing; Indium; Prototypes; Pulse amplifiers; Telescopes; Testing; Very large scale integration; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5696-9
DOI :
10.1109/NSSMIC.1999.842540