• DocumentCode
    3518758
  • Title

    Nonvolatile Configuration Memory Cell for Low Power Field Programmable Gate Array

  • Author

    Yasuda, Shinichi ; Ikegami, Kazutaka ; Tanamoto, Tetsufumi ; Kinoshita, Atsuhiro ; Abe, Keiko ; Fujita, Shinobu

  • Author_Institution
    Adv. LSI Technol. Lab., Toshiba Corp., Japan
  • fYear
    2011
  • fDate
    22-25 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new FPGA design using nonvolatile configuration memory (NCM) has been presented. NCM with large On/Off resistance ratio, such as nanoionic memory, is adopted to replace SRAM-based configuration memory. Since NCM is fabricated between interconnect layers of CMOS, silicon area is smaller than in the case of SRAM. Unlike previous FPGAs with nonvolatile programmable wires, we took architecture based approach for designing memory cell, since the cell area of programmable wire cell becomes larger than conventional SRAM-based configuration memory. We designed high-density NCM layout to evaluate the area reduction of configuration memory and verified the area of NCM is about 3.8X smaller than that of SRAM-based configuration memory, while it is 19X larger in the case of the programmable wire than SRAM-based one. It is expected that NCM achieved about over 20% reduction in total FPGA area. Area reduction of configuration memory also shortens the interconnect length to reduce the interconnect delay. Furthermore, nonvolatility achieves low power consumption with power gating.
  • Keywords
    CMOS memory circuits; field programmable gate arrays; random-access storage; CMOS technology; FPGA design; SRAM-based configuration memory; high-density NCM layout; low power field programmable gate array; nanoionic memory; nonvolatile configuration memory cell; nonvolatile programmable wires; Field programmable gate arrays; Logic gates; Memory management; Nonvolatile memory; Programming; Random access memory; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2011 3rd IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4577-0225-9
  • Electronic_ISBN
    978-1-4577-0224-2
  • Type

    conf

  • DOI
    10.1109/IMW.2011.5873238
  • Filename
    5873238