• DocumentCode
    3518787
  • Title

    Identification and analysis of distinct features in imaging thin-film solar cells

  • Author

    Zaunbrecher, Katherine N. ; Johnston, Steven W. ; Sites, James R.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    Electroluminescence and photoluminescence (EL and PL) are two imaging techniques employed at NREL that are used to qualitatively evaluate solar cells. In this work, imaging lab-scale CdTe and CIGS devices provides information about small-area PV response, which will aid in determining the effects of non-uniformities on cell performance. EL, PL, and dark lock-in thermography signatures are first catalogued. Their responses to varying conditions are then studied. Further analysis includes acquiring spectral data, making microscopy measurements, and correlating luminescence to device performance. The goal of this work is to quantitatively determine non-uniformity effects on cell performance using rapid imaging techniques.
  • Keywords
    II-VI semiconductors; cadmium compounds; copper compounds; electroluminescence; gallium compounds; indium compounds; infrared imaging; photoluminescence; semiconductor thin films; solar cells; CIGS; CdTe; EL techniques; PL techniques; dark lock-in thermography signatures; electroluminescence imaging techniques; imaging thin-film solar cells; microscopy measurements; nonuniformity effects; photoluminescence imaging techniques; small-area PV response; spectral data; Performance evaluation; Photoluminescence; Photovoltaic cells; Scanning electron microscopy; electroluminescence; imaging; photoluminescence; photovoltaic cells; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6317926
  • Filename
    6317926