DocumentCode :
3518787
Title :
Identification and analysis of distinct features in imaging thin-film solar cells
Author :
Zaunbrecher, Katherine N. ; Johnston, Steven W. ; Sites, James R.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
Electroluminescence and photoluminescence (EL and PL) are two imaging techniques employed at NREL that are used to qualitatively evaluate solar cells. In this work, imaging lab-scale CdTe and CIGS devices provides information about small-area PV response, which will aid in determining the effects of non-uniformities on cell performance. EL, PL, and dark lock-in thermography signatures are first catalogued. Their responses to varying conditions are then studied. Further analysis includes acquiring spectral data, making microscopy measurements, and correlating luminescence to device performance. The goal of this work is to quantitatively determine non-uniformity effects on cell performance using rapid imaging techniques.
Keywords :
II-VI semiconductors; cadmium compounds; copper compounds; electroluminescence; gallium compounds; indium compounds; infrared imaging; photoluminescence; semiconductor thin films; solar cells; CIGS; CdTe; EL techniques; PL techniques; dark lock-in thermography signatures; electroluminescence imaging techniques; imaging thin-film solar cells; microscopy measurements; nonuniformity effects; photoluminescence imaging techniques; small-area PV response; spectral data; Performance evaluation; Photoluminescence; Photovoltaic cells; Scanning electron microscopy; electroluminescence; imaging; photoluminescence; photovoltaic cells; thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317926
Filename :
6317926
Link To Document :
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