• DocumentCode
    35188
  • Title

    Analytical Prediction of the Main Oscillation Power and Spurious Levels in Optoelectronic Oscillators

  • Author

    Hosseini, Seyed Ebrahim ; Banai, Ali

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
  • Volume
    32
  • Issue
    5
  • fYear
    2014
  • fDate
    1-Mar-14
  • Firstpage
    978
  • Lastpage
    985
  • Abstract
    We use a nonlinear analytic approach to predict the main oscillation mode power and spurious levels in ultrapure microwave optoelectronic oscillators (OEOs). This approach takes into account N simultaneously mode falling inside the RF filter bandwidth and calculates all the dominant InterModulation Products (IMPs) that fall in the fundamental zone. We show that nonlinear microwave photonic links exhibit the capture effect. By considering this effect, we derive analytical expressions that govern the behavior of the OEOs in the steady state. We find that when the small-signal open-loop gain is increased beyond a critical value, OEOs start a multimode operation from which the spurious levels grow rapidly. Our analytical predictions are verified by numerical simulations and experimental data.
  • Keywords
    electro-optical filters; electro-optical modulation; integrated optics; integrated optoelectronics; microwave oscillators; microwave photonics; nonlinear optics; numerical analysis; IMP; InterModulation Products; OEO; RF filter bandwidth; analytical prediction; capture effect; critical value; fundamental zone; main oscillation mode power; multimode operation; nonlinear analytic approach; nonlinear microwave photonic link; numerical simulations; small-signal open-loop gain; spurious level; steady state; ultrapure microwave optoelectronic oscillator; Gain; Microwave oscillators; Microwave photonics; Noise; Radio frequency; Steady-state; Analytical models; capture effect; optoelectronic oscillators; spurious levels;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2013.2295758
  • Filename
    6690182