Title :
Real-Time Beam Profile Uniformity Monitoring System
Author :
Britvitch, Ilia ; Hajdas, Wojtek ; Scherrer, S. ; Egli, Ken ; Mozzanica, A. ; Schmitt, Benoit
Author_Institution :
Paul Scherrer Inst., Villigen, Switzerland
Abstract :
New, multi-pixel, air-filled ionization chamber for beam monitoring was constructed. For processing of 400 input signals, it utilizes a dedicated, homemade ASIC. Device parameters: sensitivity, resolution, dynamic range, etc. are discussed together with results from the particle beam tests.
Keywords :
application specific integrated circuits; beam handling equipment; particle beam diagnostics; semiconductor counters; air-filled ionization chamber; device parameters; homemade ASIC; multipixel beam monitoring; particle beam tests; real-time beam profile uniformity monitoring system; Atmospheric measurements; Instruments; Particle beam measurements; Particle beams; Particle measurements; Protons; Structural beams; High energy physics instrumentation; instrumentation and measurement; particle beam measurements; radiation monitoring;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2280032
