• DocumentCode
    3519175
  • Title

    High Resolution Optical Phase Response Measurement Using Single Sideband Modulation

  • Author

    Adams, D.B. ; Madsen, C.K.

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A high-resolution measurement to characterize the optical amplitude and phase is presented that uses single sideband modulation, a swept-wavelength tunable laser, and a Mach-Zehnder interferometer for frequency offset accuracy.
  • Keywords
    Mach-Zehnder interferometers; laser tuning; optical modulation; Mach-Zehnder interferometer; frequency offset accuracy; optical phase response measurement; single sideband modulation; swept-wavelength tunable laser; Frequency; High speed optical techniques; Optical filters; Optical interferometry; Optical mixing; Optical modulation; Optical resonators; Optical sensors; Phase measurement; Phase modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber communication/National Fiber Optic Engineers Conference, 2008. OFC/NFOEC 2008. Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-55752-856-8
  • Type

    conf

  • DOI
    10.1109/OFC.2008.4528050
  • Filename
    4528050
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3519175