• DocumentCode
    3519258
  • Title

    Effect of stand-off height on the reliability of Cu/Sn-4.8Bi-2Ag/Cu solder joint

  • Author

    Liu, Hui ; Zhou, Longzao ; Li, Jun ; Wu, Fengshun ; Wu, Yiping

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    1094
  • Lastpage
    1096
  • Abstract
    This study investigates intermetallic compound (IMC) growing behavior at different stand-off heights (SOH) in miniature Cu/Sn-4.8Bi-2Ag/Cu solder joints. The solder joints with SOH of 10, 20, 50 and 100 mum will be studied, and the microstructures and compositions will be discussed. Meanwhile the tensile strength and the fracture mode of Sn-4.8Bi-2Ag solder joints will be also studied. The results show that Bi appears as particles spreading over the bulk of the solder joint, which will increase the strength of the solder joint. It is also found that the content of the IMC layer increases as the SOH reduces. The SOH of the solder joint plays an important role in the tensile strength. Tensile strength of the solder joint decreases as the SOH reduces, which correlates with the change of microstructures and compositions in the solder joints. The fractured path of the solder joint transfers from the bulk of the solder joint to the interface between IMC and solder, and the fracture mode tends to be brittle fracture.
  • Keywords
    bismuth alloys; brittle fracture; copper alloys; electronics packaging; metallisation; reliability; silver alloys; soldering; tensile strength; tin alloys; Cu-Sn-Bi-Ag-Cu; brittle fracture; intermetallic compound; size 10 mum; size 100 mum; size 20 mum; size 50 mum; solder joint reliability; stand-off height; tensile strength; Electronics packaging; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Materials science and technology; Microstructure; Scanning electron microscopy; Soldering; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270592
  • Filename
    5270592