Paperless manufacturing-a challenge now and in the future

Author

Remson, Mark G.

Author_Institution

VLSI Technol. Inc., San Antonio, TX, USA

fYear

1991

fDate

20-22 May 1991

Firstpage

89

Lastpage

94

Abstract

In 1988, VLSI San Antonio Wafer Fab was started with and continues to utilize a paperless CIM (computer-integrated manufacturing), engineering, and inventory system, including lot-based, time-event-based data tracking. The author describes the implementation of this paperless manufacturing system and the benefits derived in cycle time improvement, process improvement, wafer traceability, and real-time engineering information availability. In addition, problems and difficulties of implementation and maintenance of the system as well as future directions are described

Keywords

integrated circuit manufacture; manufacturing computer control; manufacturing data processing; production control; VLSI San Antonio Wafer Fab; benefits; challenge; cycle time improvement; engineering system; future directions; implementation; inventory system; lot based data tracking; paperless CIM system; paperless manufacturing system; process improvement; real-time engineering information availability; system maintenance; time-event-based data tracking; wafer traceability; Computer integrated manufacturing; Control systems; Floors; Manufacturing automation; Manufacturing processes; Manufacturing systems; Pulp manufacturing; Real time systems; Semiconductor device manufacture; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Manufacturing Science Symposium, 1991. ISMSS 1991., IEEE/SEMI International

Conference_Location

Burlingame, CA

Print_ISBN

0-7803-0027-0

Type

conf

DOI

10.1109/ISMSS.1991.146272

Filename

146272