Title :
Paperless manufacturing-a challenge now and in the future
Author_Institution :
VLSI Technol. Inc., San Antonio, TX, USA
Abstract :
In 1988, VLSI San Antonio Wafer Fab was started with and continues to utilize a paperless CIM (computer-integrated manufacturing), engineering, and inventory system, including lot-based, time-event-based data tracking. The author describes the implementation of this paperless manufacturing system and the benefits derived in cycle time improvement, process improvement, wafer traceability, and real-time engineering information availability. In addition, problems and difficulties of implementation and maintenance of the system as well as future directions are described
Keywords :
integrated circuit manufacture; manufacturing computer control; manufacturing data processing; production control; VLSI San Antonio Wafer Fab; benefits; challenge; cycle time improvement; engineering system; future directions; implementation; inventory system; lot based data tracking; paperless CIM system; paperless manufacturing system; process improvement; real-time engineering information availability; system maintenance; time-event-based data tracking; wafer traceability; Computer integrated manufacturing; Control systems; Floors; Manufacturing automation; Manufacturing processes; Manufacturing systems; Pulp manufacturing; Real time systems; Semiconductor device manufacture; Very large scale integration;
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1991. ISMSS 1991., IEEE/SEMI International
Conference_Location :
Burlingame, CA
Print_ISBN :
0-7803-0027-0
DOI :
10.1109/ISMSS.1991.146272
