• DocumentCode
    3519292
  • Title

    Investigation of lead-free BGA solder joint reliability under 4-point bending using PWB strain-rate analysis

  • Author

    Song, Fubin ; Newman, Keith ; Yang, Chaoran ; Lee, S. W. Ricky

  • Author_Institution
    Electron. Packaging Lab., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    863
  • Lastpage
    868
  • Abstract
    Board level solder joint reliability was evaluated using a 4-point monotonic bending test on different BGA package assemblies, including a 51 × 51 mm 2400 CBGA and a 40 × 40 mm 1517 PBGA. The edgebond epoxy was applied between the package samples and solder-attached printed wiring boards (PWBs). During the bending test, the PWB strain, bending force and daisy-chain resistance were monitored in real time. The daisy-chain resistance and PWB strain-rate during the bending test were cross-referenced for detailed comparison. The test results indicated that the PWB strain-rate showed an obvious change at the moment of package failure. The PWB strain-rate can be a useful monitoring method for detecting the onset of the solder joint failure during the monotonic bending test.
  • Keywords
    ball grid arrays; bending; electric resistance; electronics industry; mechanical testing; printed circuits; reliability; solders; 4-point monotonic bending test; CBGA; PBGA; PWB; bending force; board level solder joint reliability; daisy-chain resistance; edgebond epoxy; lead-free BGA; package failure; printed wiring boards; solder joint failure; strain rate analysis; Assembly; Capacitive sensors; Circuit testing; Condition monitoring; Electronics packaging; Environmentally friendly manufacturing techniques; Integrated circuit interconnections; Lead; Soldering; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416422
  • Filename
    5416422