• DocumentCode
    3519319
  • Title

    A Method for Analog Circuits Fault Diagnosis by Neural Network and Virtual Instruments

  • Author

    Li Xiang ; Zhang Yang ; Wang Shujuan ; Zhai Guofu

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
  • fYear
    2011
  • fDate
    28-29 May 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The values of analog circuits´ input and output signals and the component parameters are continuous, and meanwhile there are inevitable tolerance and non-linear components in analog circuits, therefore the presence of these factors increases complexity of the analog circuits fault diagnosis. RBF and BP neural network are two widely used feedforward neural networks, LabVIEW is a graphical programming language, which can provide users with a visual and convenient design environment. On the basis of RBF and BP neural network, the theory and method of analog circuits fault diagnosis based on ANN (Artificial Neural Network) are described. By the way of hybrid programming with LabVIEW and Matlab, the API for analog circuits fault diagnosis is established. Experimental simulation study is carried out, respectively, using RBF and BP neural network. From the fault diagnosis results, it can be seen that the method of combining ANN with LabVIEW can not only show the fault diagnosis results visually and directly, but also ensure a considerable diagnosis accuracy.
  • Keywords
    analogue circuits; application program interfaces; circuit analysis computing; circuit complexity; fault diagnosis; radial basis function networks; recurrent neural nets; virtual instrumentation; API; BP neural network; LabVIEW; Matlab; RBF neural network; analog circuit fault diagnosis; artificial neural network; feedforward neural networks; graphical programming language; nonlinear components; virtual instruments; Analog circuits; Artificial neural networks; Circuit faults; Fault diagnosis; Feature extraction; Neurons; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems and Applications (ISA), 2011 3rd International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-9855-0
  • Electronic_ISBN
    978-1-4244-9857-4
  • Type

    conf

  • DOI
    10.1109/ISA.2011.5873270
  • Filename
    5873270