• DocumentCode
    3519453
  • Title

    Study of isothermal bending fatigue test

  • Author

    Lou, Minyi ; Wen, Long ; Chen, Zhengrong ; Zhou, Jianwei ; Wang, Qian ; Lee, Jaisung

  • Author_Institution
    Samsung Semicond. (China) R&D Co. Ltd., Suzhou, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    1246
  • Lastpage
    1255
  • Abstract
    TC test is very important for solder joint reliability, but the test time for TC test is very long, normally it cost about 2 months. In order to shorten TC test time, many researchers study the new test method to replace traditional TC test, such as bending fatigue test. However, there´s still some limit for this field study. Considering the actual user condition, the final product not only experience mechanical loading, but also thermal loading. Therefore, isothermal bending test (-25degC, 25degC, 75degC, 125degC) were studied to research the relationship of lifetime and failure mechanism between TC test and bending fatigue test. ANSYS was used to simulate isothermal bending fatigue test and also compare with traditional TC test.
  • Keywords
    bending; fatigue testing; integrated circuit reliability; soldering; ANSYS; actual user condition; failure mechanism; fatigue test; isothermal bending; mechanical loading; solder joint reliability; thermal loading; Electronic equipment testing; Electronic packaging thermal management; Failure analysis; Fatigue; Isothermal processes; Life testing; Semiconductor device testing; System testing; Temperature; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270600
  • Filename
    5270600