DocumentCode
3519453
Title
Study of isothermal bending fatigue test
Author
Lou, Minyi ; Wen, Long ; Chen, Zhengrong ; Zhou, Jianwei ; Wang, Qian ; Lee, Jaisung
Author_Institution
Samsung Semicond. (China) R&D Co. Ltd., Suzhou, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
1246
Lastpage
1255
Abstract
TC test is very important for solder joint reliability, but the test time for TC test is very long, normally it cost about 2 months. In order to shorten TC test time, many researchers study the new test method to replace traditional TC test, such as bending fatigue test. However, there´s still some limit for this field study. Considering the actual user condition, the final product not only experience mechanical loading, but also thermal loading. Therefore, isothermal bending test (-25degC, 25degC, 75degC, 125degC) were studied to research the relationship of lifetime and failure mechanism between TC test and bending fatigue test. ANSYS was used to simulate isothermal bending fatigue test and also compare with traditional TC test.
Keywords
bending; fatigue testing; integrated circuit reliability; soldering; ANSYS; actual user condition; failure mechanism; fatigue test; isothermal bending; mechanical loading; solder joint reliability; thermal loading; Electronic equipment testing; Electronic packaging thermal management; Failure analysis; Fatigue; Isothermal processes; Life testing; Semiconductor device testing; System testing; Temperature; Thermal loading;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270600
Filename
5270600
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