Title :
Ball impact response based on modeling techniques
Author :
Shinohara, Kazunori ; Yu, Qiang ; Fujita, Masato ; Ishii, Hideaki ; Ishikawa, Hisao
Author_Institution :
Kanagawa Acad. of Sci. & Technol., Kawasaki, Japan
Abstract :
This paper focuses on the study of the drop-impact reliability of solder joints of integrated circuit components on printed circuit boards. The impact strength and impact toughness of solder alloys are investigated by performing the ball impact test (an experimental approach). For comparison with experimental results, the fracture of a single solder joint specimen is numerically simulated using the finite element method. The fatigue strength of solder joints depends strongly on the structure of the intermetallic compound formed between solder balls and copper pads. The stiffness of all interfaces reduces due to the local stress concentration. This stress concentration occurs because of the formation of the structure between the solder ball and the substrate. The reliability of a product depends on the interface between the solder ball and the substrate.
Keywords :
fatigue; finite element analysis; fracture toughness; impact strength; integrated circuit reliability; printed circuits; solders; Cu; ball impact response; copper pads; drop impact reliability; fatigue strength; finite element method; impact strength; impact toughness; integrated circuit components; intermetallic compound; printed circuit boards; solder alloys; solder joints; Circuit simulation; Circuit testing; Fatigue; Finite element methods; Integrated circuit reliability; Numerical simulation; Performance evaluation; Printed circuits; Soldering; Stress;
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
DOI :
10.1109/EPTC.2009.5416434