Title :
Analysis of geometrical structure and transport property in InAs/Si heterojunction nanowire tunneling field effect transistors
Author :
Miyoshi, Yasuaki ; Ogawa, Matsuto ; Souma, Satofumi ; Nakamura, Hajime
Author_Institution :
Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
Abstract :
Band-to-band tunneling (BTBT) field-effect transistors (FETs) is one of the promising strategies in reducing the leakage current and improving the subthreshold characteristics compared with the conventional metal-oxide-semiconductor field-effect transistors (MOSFETs). However, BTBT-FETs have an intrinsic drawback of small on-current. We explore numerically the possibility of using the InAs/Si heterojunction nanowire (NW) to resolve such intrinsic difficulty in BTBT-FETs, and found that the use of the InAs/Si heterojunction nanowire is advantageous in increasing the on-current compared with the Si homojunction nanowires.
Keywords :
elemental semiconductors; field effect transistors; indium compounds; leakage currents; nanoelectronics; nanowires; semiconductor heterojunctions; silicon; BTBT-FET; InAs-Si; MOSFET; band-to-band tunneling field-effect transistors; geometrical structure analysis; heterojunction nanowire tunneling field effect transistors; homojunction nanowires; leakage current; metal-oxide-semiconductor field-effect transistors; transport property; Bridges; Logic gates; Nanowires; Open systems; Silicon;
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
Conference_Location :
Osaka
Print_ISBN :
978-1-61284-419-0
DOI :
10.1109/SISPAD.2011.6034961