• DocumentCode
    3519515
  • Title

    Analysis of geometrical structure and transport property in InAs/Si heterojunction nanowire tunneling field effect transistors

  • Author

    Miyoshi, Yasuaki ; Ogawa, Matsuto ; Souma, Satofumi ; Nakamura, Hajime

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
  • fYear
    2011
  • fDate
    8-10 Sept. 2011
  • Firstpage
    227
  • Lastpage
    230
  • Abstract
    Band-to-band tunneling (BTBT) field-effect transistors (FETs) is one of the promising strategies in reducing the leakage current and improving the subthreshold characteristics compared with the conventional metal-oxide-semiconductor field-effect transistors (MOSFETs). However, BTBT-FETs have an intrinsic drawback of small on-current. We explore numerically the possibility of using the InAs/Si heterojunction nanowire (NW) to resolve such intrinsic difficulty in BTBT-FETs, and found that the use of the InAs/Si heterojunction nanowire is advantageous in increasing the on-current compared with the Si homojunction nanowires.
  • Keywords
    elemental semiconductors; field effect transistors; indium compounds; leakage currents; nanoelectronics; nanowires; semiconductor heterojunctions; silicon; BTBT-FET; InAs-Si; MOSFET; band-to-band tunneling field-effect transistors; geometrical structure analysis; heterojunction nanowire tunneling field effect transistors; homojunction nanowires; leakage current; metal-oxide-semiconductor field-effect transistors; transport property; Bridges; Logic gates; Nanowires; Open systems; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
  • Conference_Location
    Osaka
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-61284-419-0
  • Type

    conf

  • DOI
    10.1109/SISPAD.2011.6034961
  • Filename
    6034961