Title : 
Quantum cascade lasers based on guided modes at a metal-semiconductor interface
         
        
            Author : 
Sirtori, C. ; Gmachl, C. ; Capasso, Federico ; Faist, J. ; Sivco, D.L. ; Cho, Andrew Y.
         
        
            Author_Institution : 
Lab. Central de Recherches, Thomson-CSF, Orsay, France
         
        
        
        
        
        
            Abstract : 
Summary form only given. Planar waveguides for long-wavelength quantum cascade (QC) lasers require thick cladding layers. This prolongs and complicates the growth and processing procedures of these lasers. In this paper we demonstrate that optical waveguiding for a laser in this wavelength range can also be achieved using electromagnetic surface waves at a metal-semiconductor interface directly above the active region of the laser. No cladding layer is needed. The interface-guided modes are transverse-magnetic modes existing at the interface between a metal and a semiconductor, which have dielectric constants opposite in sign. Therefore, the metal layer, which is usually deposited on the top surface of a semiconductor laser for the purpose of an electric contact, can be also exploited to provide the waveguide interface.
         
        
            Keywords : 
quantum well lasers; semiconductor-metal boundaries; surface electromagnetic waves; waveguide lasers; 10 to 15 micron; electromagnetic surface waves; guided modes; interface-guided modes; long-wavelength lasers; metal-semiconductor interface; planar waveguides; quantum cascade lasers; reduced device thickness; ridge waveguides; transverse-magnetic modes; Electromagnetic waveguides; Laser modes; Optical planar waveguides; Optical surface waves; Optical waveguides; Quantum cascade lasers; Semiconductor lasers; Surface emitting lasers; Surface waves; Waveguide lasers;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
         
        
            Conference_Location : 
San Francisco, CA, USA
         
        
            Print_ISBN : 
1-55752-339-0
         
        
        
            DOI : 
10.1109/CLEO.1998.675958