• DocumentCode
    3519749
  • Title

    Detecting multiple symmetries with extended SIFT

  • Author

    Chen, Qian ; Wu, Haiyuan ; Taki, Hirokazu

  • Author_Institution
    Fac. of Syst. Eng., Wakayama Univ., Wakayama, Japan
  • fYear
    2011
  • fDate
    28-28 Nov. 2011
  • Firstpage
    115
  • Lastpage
    119
  • Abstract
    This paper describes an effective method for detecting multiple symmetric objects in an image. A “pseudo-affine invariant SIFT” is used for detecting symmetric feature pairs in perspective images. Candidates of symmetric axes are estimated from every two symmetric feature pairs, and the one supported by the most symmetric feature pairs is detected as the most relevant symmetric axis of a symmetric object. The symmetric feature pairs supporting the symmetric axis are then used to detect other symmetric axes in the same symmetric object. This procedure is applied repeatedly to the symmetric feature pairs after eliminating the ones that support the already detected symmetric axes to detect all symmetric objects in the image. The effectiveness of this method has been confirmed through several experiments using real images and common image databases.
  • Keywords
    feature extraction; object detection; realistic images; image database; multiple symmetric object detection; perspective image; pseudoaffine invariant SIFT; real image; symmetric axis; symmetric feature pairs detection; Databases; Detectors; Feature extraction; Joining processes; Shape; Three dimensional displays; Transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ACPR), 2011 First Asian Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4577-0122-1
  • Type

    conf

  • DOI
    10.1109/ACPR.2011.6166683
  • Filename
    6166683