DocumentCode
3519749
Title
Detecting multiple symmetries with extended SIFT
Author
Chen, Qian ; Wu, Haiyuan ; Taki, Hirokazu
Author_Institution
Fac. of Syst. Eng., Wakayama Univ., Wakayama, Japan
fYear
2011
fDate
28-28 Nov. 2011
Firstpage
115
Lastpage
119
Abstract
This paper describes an effective method for detecting multiple symmetric objects in an image. A “pseudo-affine invariant SIFT” is used for detecting symmetric feature pairs in perspective images. Candidates of symmetric axes are estimated from every two symmetric feature pairs, and the one supported by the most symmetric feature pairs is detected as the most relevant symmetric axis of a symmetric object. The symmetric feature pairs supporting the symmetric axis are then used to detect other symmetric axes in the same symmetric object. This procedure is applied repeatedly to the symmetric feature pairs after eliminating the ones that support the already detected symmetric axes to detect all symmetric objects in the image. The effectiveness of this method has been confirmed through several experiments using real images and common image databases.
Keywords
feature extraction; object detection; realistic images; image database; multiple symmetric object detection; perspective image; pseudoaffine invariant SIFT; real image; symmetric axis; symmetric feature pairs detection; Databases; Detectors; Feature extraction; Joining processes; Shape; Three dimensional displays; Transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ACPR), 2011 First Asian Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4577-0122-1
Type
conf
DOI
10.1109/ACPR.2011.6166683
Filename
6166683
Link To Document