DocumentCode :
3519749
Title :
Detecting multiple symmetries with extended SIFT
Author :
Chen, Qian ; Wu, Haiyuan ; Taki, Hirokazu
Author_Institution :
Fac. of Syst. Eng., Wakayama Univ., Wakayama, Japan
fYear :
2011
fDate :
28-28 Nov. 2011
Firstpage :
115
Lastpage :
119
Abstract :
This paper describes an effective method for detecting multiple symmetric objects in an image. A “pseudo-affine invariant SIFT” is used for detecting symmetric feature pairs in perspective images. Candidates of symmetric axes are estimated from every two symmetric feature pairs, and the one supported by the most symmetric feature pairs is detected as the most relevant symmetric axis of a symmetric object. The symmetric feature pairs supporting the symmetric axis are then used to detect other symmetric axes in the same symmetric object. This procedure is applied repeatedly to the symmetric feature pairs after eliminating the ones that support the already detected symmetric axes to detect all symmetric objects in the image. The effectiveness of this method has been confirmed through several experiments using real images and common image databases.
Keywords :
feature extraction; object detection; realistic images; image database; multiple symmetric object detection; perspective image; pseudoaffine invariant SIFT; real image; symmetric axis; symmetric feature pairs detection; Databases; Detectors; Feature extraction; Joining processes; Shape; Three dimensional displays; Transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ACPR), 2011 First Asian Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0122-1
Type :
conf
DOI :
10.1109/ACPR.2011.6166683
Filename :
6166683
Link To Document :
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