DocumentCode :
3519757
Title :
Adaptive Patch Alignment Based Local Binary Patterns for face recognition
Author :
Li, Yuelong ; Feng, Jufu
Author_Institution :
Key Lab. of Machine Perception (MOE), Peking Univ., Beijing, China
fYear :
2011
fDate :
28-28 Nov. 2011
Firstpage :
269
Lastpage :
272
Abstract :
This paper introduces a novel face recognition method based on Adaptive Patch Alignment Based Local Binary Patterns (APALBP). LBP is one of the most effective features to face recognition. However, the effectiveness of this feature greatly relies on face alignment, i.e., since LBP is in fact an image feature rather than face feature, pose difference will directly influence the recognition performance. APALBP is much more robust than original LBP. The novelty of this paper comes from 1) enrolling an adaptive patch alignment method, so that LBP feature can be directly applied on unaligned images; 2) putting forward a new solution to small sample problems in face recognition; 3) introducing a novel feature extraction which could be extended to general recognition problems. We present improved recognition results to demonstrate the effectiveness of our approach.
Keywords :
face recognition; feature extraction; APALBP; adaptive patch alignment based local binary patterns; face alignment; face feature; face recognition; feature extraction; image feature; pose difference; Databases; Face; Face recognition; Feature extraction; Histograms; Humans; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ACPR), 2011 First Asian Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0122-1
Type :
conf
DOI :
10.1109/ACPR.2011.6166684
Filename :
6166684
Link To Document :
بازگشت