DocumentCode
3519858
Title
Fast qualification using thermal shock combined with moisture absorption
Author
Ma, Xiaosong ; Zhang, G.Q. ; Jansen, K.M.B. ; van Driel, W.D. ; van der Sluis, O. ; Ernst, L.J. ; Regard, Charles ; Gautier, Christian ; Frémont, Hélène
Author_Institution
Delft Univ. of Technol., Delft, Netherlands
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
1206
Lastpage
1211
Abstract
Time to market is becoming one of the most important factors because of the fierce market competition. However, traditional reliability and interface toughness characterization tests take very long time. For example, moisture sensitivity level assessment (MSL1) will take 168 hours pre conditioning at 85degC/85%RH and tradition thermal cycling takes even longer time. The long preconditioning times are chosen to ensure that also the thicker sections of a package are completely saturated. Thinner package, however, are already saturated after one to two days. In this study, we therefore investigated whether it would be possible to speed up the qualification process by shortening the preconditioning time. We focus in particular on the interface toughness. From our four point bending test and analysis, it is found that temperature has great effects on the interface toughness and moisture also has small effects on the interface toughness. In order to do the fast qualification test, thermal shock cycling tests combined with moisture absorption are performed. Experiments show that moisture can speed up the delamination.
Keywords
bending; thermal management (packaging); thermal shock; bending test; interface toughness; moisture absorption; moisture sensitivity level assessment; thermal shock cycling test; Absorption; Delamination; Electric shock; Moisture; Packaging; Performance evaluation; Qualifications; Temperature; Testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270620
Filename
5270620
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