DocumentCode
3519885
Title
Thermal-mechanical failure and life analysis on CBGA package used for great scale FPGA chip
Author
Li, Wenchang ; Zhang, Xiaojun
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, UESTC, Chengdu, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
1216
Lastpage
1219
Abstract
CBGA (ceramic ball grid array) is one kind of advanced package for FPGA, which can fulfill the demands of high interconnect density, high thermal and electronic performance, high chip-assembling yields, high reliability. But in multiple loading environments, CBGA has the invalidation mode of solder joint thermal-mechanical failure, which will influence the long term reliability of FPGA circuits. But there is few research on the China native made CBGA package. In this paper research of finite element analysis and solder joint fatigue predictive equation have been made on some of CBGA packages, and some failure prediction and ATC test results have been given.
Keywords
ball grid arrays; ceramic packaging; chip scale packaging; field programmable gate arrays; finite element analysis; integrated circuit modelling; integrated circuit reliability; life testing; solders; thermal stress cracking; ATC test; CBGA package; FPGA chip; ceramic ball grid array; circuit reliability; failure prediction; finite element analysis; life analysis; solder joint fatigue predictive equation; thermal fatigue; thermal-mechanical failure; Ceramics; Chip scale packaging; Electronic packaging thermal management; Electronics packaging; Failure analysis; Field programmable gate arrays; Finite element methods; Integrated circuit interconnections; Soldering; Thermal loading;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270622
Filename
5270622
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