• DocumentCode
    3519885
  • Title

    Thermal-mechanical failure and life analysis on CBGA package used for great scale FPGA chip

  • Author

    Li, Wenchang ; Zhang, Xiaojun

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, UESTC, Chengdu, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    1216
  • Lastpage
    1219
  • Abstract
    CBGA (ceramic ball grid array) is one kind of advanced package for FPGA, which can fulfill the demands of high interconnect density, high thermal and electronic performance, high chip-assembling yields, high reliability. But in multiple loading environments, CBGA has the invalidation mode of solder joint thermal-mechanical failure, which will influence the long term reliability of FPGA circuits. But there is few research on the China native made CBGA package. In this paper research of finite element analysis and solder joint fatigue predictive equation have been made on some of CBGA packages, and some failure prediction and ATC test results have been given.
  • Keywords
    ball grid arrays; ceramic packaging; chip scale packaging; field programmable gate arrays; finite element analysis; integrated circuit modelling; integrated circuit reliability; life testing; solders; thermal stress cracking; ATC test; CBGA package; FPGA chip; ceramic ball grid array; circuit reliability; failure prediction; finite element analysis; life analysis; solder joint fatigue predictive equation; thermal fatigue; thermal-mechanical failure; Ceramics; Chip scale packaging; Electronic packaging thermal management; Electronics packaging; Failure analysis; Field programmable gate arrays; Finite element methods; Integrated circuit interconnections; Soldering; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270622
  • Filename
    5270622