DocumentCode :
3520031
Title :
Electrically conductive adhesives with sintered silver nanowires
Author :
Zhang, Zhongxian ; Chen, Xiangyan ; Yang, Haowei ; Fu, Huiying ; Xiao, Fei
Author_Institution :
Dept. of Mater. Sci., Fudan Univ., Shanghai, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
834
Lastpage :
837
Abstract :
Concerning the hazard to human and environment by lead, the lead-free solders and the electrically conductive adhesives (ECAs) have been considered as the most promising alternatives of the tin-lead solder. Electrically conductive adhesives offer numerous advantages compared to conventional solder technology such as environmental friendliness, mild processing conditions, low stress on the substrates, and fine pitch interconnect capability. It has received considerable attention in microelectronic packaging that the nano-size metal particles fuse at much lower temperature than the melting point of the bulk metal. The sintering of nano-size silver in ECAs can reduce the number of contact points between fillers and increase the conductivity of ECAs. The silver nanowires with a slenderness ratio of 50~60 were successfully synthesized through a polyol process and characterized by field emission scanning electron microscopy (SEM) in this paper. The silver nanowires began to sinter at 200degC and conductive adhesives filled with silver nanowires were studied.
Keywords :
conductive adhesives; field emission electron microscopy; fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; nanoelectronics; nanowires; scanning electron microscopy; silver; sintering; Ag; SEM; electrically conductive adhesives; environment hazards; environmental friendliness; field emission scanning electron microscopy; fine pitch interconnect capability; human hazards; lead solder; lead-free solders; melting point; microelectronic packaging; mild processing condition; nanosize metal particles; polyol process; sintered silver nanowires; temperature 200 C; Conductive adhesives; Environmentally friendly manufacturing techniques; Hazards; Humans; Lead; Microelectronics; Nanowires; Scanning electron microscopy; Silver; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270629
Filename :
5270629
Link To Document :
بازگشت